DESCRIPTION:

The FLIR A6260 Series is a scientific-grade Short Wave Infrared (SWIR) imaging platform developed for advanced research, industrial inspection, semiconductor analysis, laser diagnostics, and high-temperature measurement applications. Utilizing a high-performance Indium Gallium Arsenide (InGaAs) detector, the camera provides exceptional sensitivity across the 0.9 µm to 1.7 µm spectral range, allowing users to image phenomena that are invisible to conventional visible-light cameras.

Unlike traditional thermal imaging cameras operating in the MWIR or LWIR regions, the A6260 is optimized for SWIR applications such as silicon wafer inspection, semiconductor failure analysis, laser beam profiling, photovoltaic cell evaluation, optical communications research, hot object monitoring, and imaging through standard glass. The detector's excellent linearity and dynamic range make it particularly suitable for quantitative measurement applications.

The camera incorporates flexible integration time control, custom windowing modes, synchronization functions, and external triggering capabilities, allowing researchers to optimize performance for both high-speed events and low-light imaging conditions. The platform integrates seamlessly with FLIR ResearchIR software and third-party machine vision environments through GigE Vision connectivity.

The A6260 family is widely deployed in universities, national laboratories, aerospace programmes, semiconductor manufacturing facilities, laser laboratories, and industrial R&D environments requiring precise SWIR imaging and measurement capabilities.

Technical Specifications

• Series: FLIR A6260
• Detector type: InGaAs
• Spectral range: 0.9 µm to 1.7 µm
• Resolution: 640 × 512 pixels
• Pixel pitch: 15 µm
• Detector format: 327,680 pixels
• Three selectable gain states
• Integration time: User programmable
• Custom windowing modes
• External triggering capability
• Synchronization support
• GigE Vision interface
• ResearchIR software compatibility
• Manual focus optics
• Supports SWIR lens family
• High dynamic range imaging
• Temperature measurement capability
• Factory and user calibration options
• Measurement capability above 400°C when calibrated for radiometric applications

Available Variations

FLIR A6260

• Standard SWIR scientific imaging configuration
• 0.9 µm to 1.7 µm spectral response
• GigE Vision interface
• Research and industrial imaging applications

FLIR A6260sc

• Research-grade radiometric configuration
• Advanced measurement and calibration capabilities
• Full ResearchIR software support
• Scientific temperature measurement applications

Available Lens Options

• SWIR 16 mm lens
• SWIR 25 mm lens
• SWIR 35 mm lens
• Application-specific SWIR optics
• Custom filter configurations available

Key Features

• InGaAs detector technology
• 640 × 512 resolution
• SWIR operation from 0.9 µm to 1.7 µm
• High dynamic range imaging
• Excellent detector linearity
• User-selectable gain settings
• Programmable integration times
• Custom windowing capability
• External trigger support
• Synchronization functionality
• GigE Vision connectivity
• ResearchIR compatibility
• Imaging through standard glass
• Semiconductor inspection capability
• Laser beam analysis capability
• Solar cell and photovoltaic inspection
• High-temperature measurement support
• Suitable for scientific and industrial R&D applications